Technical Program

Paper Detail

Paper: WEP1.PA.2
Session: SAR Interferometry: Along and Across IV
Time: Wednesday, July 25, 10:10 - 11:10
Presentation:  Poster
Topic:  Data Analysis Methods (Optical, Multispectral,Hyperspectral, SAR): SAR Interferometry: Along and Across
Title:  AUTOMATIC INSAR PHASE MODELING AND QUALITY ASSESSMENT USING MACHINE LEARNING AND HYPOTHESIS TESTING
Authors:  Bas van de Kerkhof; Delft University of Technology, Netherlands Aerospace Centre, Massachusetts Institute of Technology 
 Victor Pankratius; Massachusetts Institute of Technology 
 Ling Chang; Delft University of Technology 
 Rob van Swol; Netherlands Aerospace Centre 
 Ramon F. Hanssen; Delft University of Technology