Technical Program

Paper Detail

Paper: MO4.R2.5
Session: SAR Interferometry: Along and Across I
Time: Monday, July 23, 18:10 - 18:30
Presentation:  Oral
Topic:  Data Analysis Methods (Optical, Multispectral,Hyperspectral, SAR): SAR Interferometry: Along and Across
Title:  TWO-DIMENSIONAL DISPLACEMENT ANALYSIS WITH SAR IMAGES BASED ON PERSISTENT SCATTERER CLUSTERING
Authors:  Daisuke Ikefuji; NEC Corporation 
 Taichi Tanaka; NEC Corporation 
 Osamu Hoshuyama; NEC Corporation